Name of the equipment: FTNIR Make & Model: JASCO FT/IR-6X , A013662116 I-Stem Registration ID: 3245489 Category of Instrument: Physics and Chemistry  Types of Analysis / Testing: Characterization Application: Used for characterization of samples, trace gas analysis, emission characterization, and custom sampling. Description of Instrument: The FT/lR-6X FTIR spectrometer with a 28° Michelson interferometer with a diode timing laser and configurable optical system.
Book through I-STEM: https://www.istem.gov.in/ Slot Booking Link I-STEM Slot Booking link for External User	Booking available for Internal and External Both Requisition form for Internals Externals

Faculty In-charge: Dr.Raman Namboothiri.C.K Email ID: raman@nitc.ac.in Phone number: 8050490458	Technical Staff: Sreelakshmi. P Email ID: sreelakshmip@nitc.ac.in	Department: Physics Department Office Email ID physics@nitc.ac.in Location Room PH102, Dept. of Physics Lab Phone No ……………………………….

Features of the equipment ● Aluminum optics ● Long-life VCSEL laser diode (HeNe as an option) ● High output ceramic source, Ge/KBr beam splitter, and DLaTGS detector. ● Emission port optics for black body measurement, external light characterization, etc. ● A full range of sampling accessories with IQX accessory recognition ● Vibration-proof optical bench ● Large sample compartment ● Corner-cube mirrors with auto-alignment to optimize energy throughput ● Purgeable and vacuum sample compartment and optical bench ● Optional detectors include – photodiodes, DLaTGS, InGaAs, InSb, MCT, and He-cooled Bolometers Range of beam splitter materials with either manual or automatic exchange	Unique features/Measurement capabilities, if any ● Optional FTIR microscopy and IR Imaging for both micro and macro measurement ● Rapid scan ● Wavenumber extension option (25,000 to 20 cm-1) ● Vibrational Circular Dichroism (VCD) option ● Powerful Data Analysis with Spectra Manager™ Suite 2.5 ● Data analysis results such as spectral comparison and sample quantification are displayed and readily available. ● A real-time data processing function can be used to verify the current spectrum during measurements. Spectra stored in thumbnails can also be overlaid with the current spectrum during sample measurements.
Instrument Technical Description and Major Specifications (This Specifications Limited to Major 5) ✔ FTIR spectrometer with a 28° Michelson interferometer and diode timing laser ✔ Wavenumber range: 25,000 to 20 cm-1 ✔ Resolution: 0.25 cm-1 ✔ S/N ratio: >47,000:1	Measurement/Sample specifications: ● The configurable optical system applies to virtually any FTIR application, from simple MidIR measurement to more complex analysis in the near and far IR. Research-based measurements are easily performed using the FT/IR-6X spectrometer with options such as full vacuum, gold-coated optics, rapid scan, and step scan. · User-exchangeable components combined with full automation make it possible to perform spectral measurements from 25,000 cm-1 to 20 cm-1 without touching the system. The FT/IR-6X spectrometer is compatible with a range of vacuum and configurable emission ports to perform experiments outside the sample compartment and is also compatible with the comprehensive range of IR microscopes.

● Quantity: 20mg/20ml.

● Sample Type: powdered, liquid, slimy, crystal,etc

● Pre-preparation: The sample should be sterile

● User instructions: ensure proper sample preparation, choose an appropriate sampling technique (ATR, transmission, etc.), and consider the sample's properties and the instrument's capabilities.

● Type of Samples to be Analyzed -  Solid, Liquid, Gas.

● Maximum No. of Samples Accepted at a Time: 4

● Minimum No of Days Required for result :1 week

● Maximum time per day: 1 hour

Internal	External Academic Institutes	National R&D Lab	Industry
Rs. 50/sample	Rs. 500/sample	Rs. 500/sample	Rs. 1500/sample