Name of the equipment: X-Ray Diffractometer Make & Model: Rigaku & SmartLab SE I-Stem Registration ID- 3245488 Category of Instrument Characterization Types of Analysis / Testing Characterization Application: • Crystal structure analysis of powder samples • Grazing incidence XRD for polycrystalline and epitaxial thin films Description of Instrument • Used for the structural analysis of materials. • Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

Book through I-STEM: https://www.istem.gov.in/ Slot Booking Link I-STEM Slot Booking link for External User

Booking available for: Internal & External Both Requisition form for Internals Externals

Faculty In-charge: Dr. Maneesh Chandran Email ID: maneesh@nitc.ac.in Phone number:  +91-9444185850

Technical Staff: Anjali C Email ID: anjalic@nitc.ac.in

Department PHY Office Email ID Department of Physics NITC

Features of the equipment ✔ Intelligent Guidance System: The SmartLab SE includes an integrated intelligent guidance software that automates the measurement process, including optics and sample alignment. This system suggests optimal hardware configurations for specific applications, ensuring users achieve high-quality data with minimal setup time. ✔ Cross-Beam Optics: This patented technology allows seamless switching between Bragg-Brentano and parallel beam geometries without needing to change optics. This feature enhances flexibility and efficiency during experiments. ✔ Detector D/teX Ultra 250: A high-speed 1D silicon strip detector. ✔ Automated Alignment: The SmartLab SE features fully automated optical alignment, significantly reducing downtime and maintenance costs. This ensures the instrument is consistently ready for use. ✔ Robust Software Suite: SmartLab Studio II software provides a comprehensive platform for measurement, analysis, data display, and reporting.

Unique features/Measurement capabilities,  if any ⮚ Reflectivity, rocking curve, and RSM analysis in thin films ⮚ SAXS, High Temperature XRD

Instrument Technical Description and Major Specifications (This Specifications Limited to Major 5) ▪ X-ray source: Cu (Wavelength: 1.54 Å) ▪ Operation mode: theta-theta ▪ Scanning range: up to 160° ▪ Software for operation, data acquisition and processing ▪ Temperature range: RT to 1200 °C

Measurement/Sample specifications: ▪ Scanning range Starts from 3 degree ▪ for GIXRD , range of ⍵ : 0.5 to 1 degree Supports various techniques such as powder diffraction, thin film analysis, small-angle X-ray scattering (SAXS),residual stress analysis

● Quantity: Powder- Minimum 20 mg, Thin Film - NA (Needs to specify the dimensions of the film sample)

● Sample Type: Powder, Thin Film, Bulk

● Pre preparations: NA

● User Instructions: Should reveal the toxicity of the sample. Sample should be well dried.

● Type of samples to be analyzed: Powder, Thin Film, Bulk

● Maximum no. of samples accepted at a time- 10

● Minimum no. of days required for analysis- 3 days

   Powder Sample

Internal	External Academic Institutes	National R&D Lab	Industry
200/- per sample	400/- per sample	800/- per sampler	1200/- per sample

Thin Film Sample (GIXRD)

Internal	External Academic Institutes	National R&D Lab	Industry
400/- per sample	800/- per sample	1600/- per sampler	2400/- per sample

   Temperature Variant Sample

Internal	External Academic Institutes	National R&D Lab	Industry
400/- per sample*	800/- per sample*	1200/- per sample*	2000/- per sample*

*The base price is for one sample at one temperature and additional 800 for each temperature variations

    SAXS(Small Angle X-Ray Scattering)

Internal	External Academic Institutes	National R&D Lab	Industry
400/- per sample*	800/- per sample*	1600/- per sample*	2400/- per sample*