Name of the equipment: X-ray diffractometer (XRD) Make & Model: PANalytical, X’ Pert3 Powder I-Stem Registration ID- 3245637 Category of Instrument Material characterization Types of Analysis / Testing Material characterization Application: X-ray diffraction (XRD) is used to identify and characterize the crystalline structure, phase composition, and other structural parameters of materials. Description of Instrument PANalytical X’Pert³ Powder is an XRD system for crystal analysis with a PIXcel 1D detector

Book through I-STEM: https://www.istem.gov.in/ Slot Booking Link (Internal) I-STEM Slot Booking link for External User

Booking available for Internal and External Both Requisition form for both Internal and External https://drive.google.com/file/d/1WLlW8T8ldsEnl3twrLh1buQ2Sso-4FfC/view?usp=drive_link

Faculty In-charge: Dr. Hanas T Email ID: hanas@nitc.ac.in Phone number: 0495228 6526

Technical Staff: Mr. Nithin Sivadas, nithinsivadas@nitc.ac.in xrdadmin@nitc.ac.in

Department Centre for Materials Characterization (CMC) Office Email ID xrdadmin@nitc.ac.in  Location Room No:101, Materials Science and Engineering Department (MESD) Lab Phone No 0495-2286545

Features of the equipment The X’Pert³ Powder XRD from PANalytical is a high-performance X-ray diffractometer with a θ/θ high-resolution goniometer, Empyrean-based modular platform, and high-power X-ray source for precise diffraction analysis. It features a PIXcel3D detector for fast data collection, diverse sample holders, HighScore Plus software for phase analysis and upgrade options for advanced techniques like GIXRD and SAXS.

Unique features/Measurement capabilities, if any Ø High-resolution goniometer Ø PIXcel3D detector Ø Software integration (HighScore Plus)

Instrument Technical Description and Major Specifications (This Specifications Limited to Major 5) § Goniometer: Vertical theta-theta; step size 0.0001° 2θ § X-ray Source: Cu anode; up to 3 kW power § Detector: PIXcel 1D; fast and low noise § Optics: Modular; supports reflection and transmission § Sample Stage: Manual; precise alignment

Measurement/Sample specifications: § Sample Type: Powder or solid flat samples § Sample Size: Typically 10–25 mm in diameter § Sample Thickness: Up to a few millimetres § Scan Range: 2θ from 5° to 110° § Scan Modes: Step scan and continuous scan

§ Quantity: Approx. 1–2 grams (depends on sample type)

§ Sample Type: Fine powder or flat solid

§ Pre-preparation: Sample should be dry and well-ground

§ User Instructions: Must specify material and required scan range

§ Type of Samples to be Analyzed: Crystalline materials (e.g., metals, ceramics, minerals)

§ Maximum No. of Samples Accepted in a Day: 17

§ Minimum No. of Days Required for Analysis: 3 days

Internal	External Academic Institutes	National R&D Lab	Industry
200/- per Sample	400/- per Sample	1200/- per Sample	2000/- per Sample